Title of article
X-ray imaging with “edge-on” microchannel plate detector: first experimental results
Author/Authors
Victor V. and Shikhaliev، نويسنده , , Polad M. and Molloi، نويسنده , , Sabee Molloi، نويسنده ,
Pages
5
From page
401
To page
405
Abstract
A novel scanning slit X-ray imaging system based on an “edge-on” microchannel plate detector was developed and tested. Images were acquired at 50 kV(p) X-ray tube voltage with a limiting spatial resolution of 7 lp/mm. The pixel noise was measured to be 0.3 count/pixel/s for a 50×70 μm2 pixel size. This photon counting detector can be considered to be virtually noise free.
Keywords
x-ray imaging , Scanning slit , MCP detector , “Edge-on” method
Journal title
Astroparticle Physics
Record number
2021128
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