Title of article :
SEU studies of the upgraded Belle vertex detector front end electronics
Author/Authors :
Korpar، نويسنده , , Samo and Krizan، نويسنده , , Peter and Fratina، نويسنده , , Sa?a، نويسنده ,
Abstract :
The paper reports on a set of measurements which were carried out to test the influence of single event upset (SEU) effects on the performance of the VA1TA chip, the front end read-out electronics unit of the upgraded silicon vertex detector for the Belle spectrometer. In addition, the functionality of the SEU correction circuits in the chip were examined.
Keywords :
Single Event Effects (SEE) , Single Event Upset (SEU) , Latch-up , Read-out electronics , Microstrip silicon vertex detectors
Journal title :
Astroparticle Physics
