Title of article
SEU studies of the upgraded Belle vertex detector front end electronics
Author/Authors
Korpar، نويسنده , , Samo and Krizan، نويسنده , , Peter and Fratina، نويسنده , , Sa?a، نويسنده ,
Pages
5
From page
195
To page
199
Abstract
The paper reports on a set of measurements which were carried out to test the influence of single event upset (SEU) effects on the performance of the VA1TA chip, the front end read-out electronics unit of the upgraded silicon vertex detector for the Belle spectrometer. In addition, the functionality of the SEU correction circuits in the chip were examined.
Keywords
Single Event Effects (SEE) , Single Event Upset (SEU) , Latch-up , Read-out electronics , Microstrip silicon vertex detectors
Journal title
Astroparticle Physics
Record number
2021191
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