Title of article
Radiation damage in silicon detectors
Author/Authors
Lindstrِm، نويسنده , , Gunnar، نويسنده ,
Pages
14
From page
30
To page
43
Abstract
Radiation damage effects in silicon detectors under severe hadron and gamma-irradiation are surveyed, focusing on bulk effects. Both macroscopic detector properties (reverse current, depletion voltage and charge collection) as also the underlying microscopic defect generation are covered. Basic results are taken from the work done in the CERN-RD48 (ROSE) collaboration updated by results of recent work. Preliminary studies on the use of dimerized float zone and Czochralski silicon as detector material show possible benefits. An essential progress in the understanding of the radiation-induced detector deterioration had recently been achieved in gamma irradiation, directly correlating defect analysis data with the macroscopic detector performance.
Keywords
Silicon detectors , Defect engineering , Radiation damage , NIEL , defect analysis , Proton-neutron-?-irradiation
Journal title
Astroparticle Physics
Record number
2021246
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