Techniques for the measurement of common mode noise in binary read-out systems

Methods have been developed to measure the amount of common mode noise present in binary read-out systems. It is demonstrated how the correlation in the occupancies of groups of channels provides a measure of the magnitude of the common mode noise they are susceptible to. At high thresholds the occupancy per event is found to yield a more sensitive test for common mode noise. The functionality of the methods is demonstrated by application to silicon microstrip detectors from ATLAS.