Title of article
Beam-loss-induced electrical stress test on CMS Silicon Strip Modules
Author/Authors
Fahrer، نويسنده , , M. and Dirkes، نويسنده , , Frank G. H. Hartmann، نويسنده , , F. and Heier، نويسنده , , S. and Macpherson، نويسنده , , A. and Müller، نويسنده , , Th. and Weiler، نويسنده , , Th.، نويسنده ,
Pages
3
From page
328
To page
330
Abstract
Based on simulated LHC beam loss scenarios, fully depleted CMS silicon tracker modules and sensors were exposed to 42 ns-long beam spills of approximately 1011 protons per spill at the PS at CERN. The ionisation dose was sufficient to short circuit the silicon sensors. The dynamic behaviour of bias voltage, leakage currents and voltages over coupling capacitors were monitored during the impact. Results of pre- and post-qualification as well as the dynamic behaviour are shown.
Keywords
Beam loss , Beam abort , Silicon sensor , Silicon strip sensor , Tracker , CMS , LHC , Silicon strip module
Journal title
Astroparticle Physics
Record number
2022410
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