Single event effects on the APV25 front-end chip

The Compact Muon Solenoid (CMS) experiment at the Large Hadron Collider at CERN will include a Silicon Strip Tracker covering a sensitive area of 206 m2. About ten million channels will be read out by APV25 front-end chips, fabricated in the 0.25 μm deep submicron process. Although permanent damage is not expected within CMS radiation levels, transient Single Event Upsets are inevitable. Moreover, localized ionization can also produce fake signals in the analog circuitry. Eight APV25 chips were exposed to a high-intensity pion beam at the Paul Scherrer Institute (Villigen/CH) to study the radiation induced effects in detail. The results, which are compatible to similar measurements performed with heavy ions, are used to predict the chip error rate at CMS.