A virtual reality instrument: near-future perspective of computer simulations of ion optics

The method of accurate modeling of complex ion optical systems is presented. It combines using SIMION 3D© with external software generating input ion sets and processing results of ion trajectory simulations. This method was used to simulate time-of-flight (TOF) mass spectrometer of secondary neutrals SARISA (Surface Analysis by Resonance Ionization of Sputtered Atoms), and results of simulations were compared to results of the experiments. It is demonstrated that the accuracy of the presented modeling method is sufficient to reproduce experimental TOF (mass) spectra and dependencies of the instrument useful yield on sputtering and ionization conditions. A concept of “virtual reality instrument” as a logical extension of the method is discussed.