Title of article
Characterization of ZnSe(Te) scintillators by frequency domain luminescence lifetime measurements
Author/Authors
Mickevi?ius، نويسنده , , J. and Tamulaitis، نويسنده , , G and Vitta، نويسنده , , P. and Zukauskas، نويسنده , , A. and Starzhinskiy، نويسنده , , N. and Ryzhikov، نويسنده , , V.، نويسنده ,
Pages
4
From page
321
To page
324
Abstract
Dynamics of photoluminescence (PL) decay in Te-doped ZnSe scintillator crystal is studied using frequency domain luminescence lifetime measurement technique, which enables simultaneous characterization of components in multicomponent PL decay in a wide time window ranging from millisecond to nanosecond domain. Evolution of decay times and relative contributions of the decay components corresponding to different PL decay mechanisms was revealed as a function of temperature.
Keywords
Frequency domain lifetime measurements , Scintillators , ZnSe
Journal title
Astroparticle Physics
Record number
2023103
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