Author/Authors :
Moreau، نويسنده , , F. and Vanel، نويسنده , , J.-C. and Drapier، نويسنده , , O. and Gonin، نويسنده , , M. and Bonnemaison، نويسنده , , A. and Cauchois، نويسنده , , A. and Geerebaert، نويسنده , , Y. and Couturier-Le Quellec، نويسنده , , S.، نويسنده ,
Abstract :
A few thousands multi-pixel photon counters (MPPC) have been characterized for the T2K 280 m near detector (ND280). For this purpose a test facility has been developed enabling the characterization of 128 MPPC per day. A mean gain value of 5.4×105 at breakdown voltage (Vbreak)+1 V with a dispersion of 2.6% has been measured at 20 °C. It is shown that the accuracy of the test facility for the gain measurement is at the level of 0.76%. At 20 °C the dark noise rates (DNR) have been measured in a range from ∼400 up to ∼730 kHz at Vbreak+1.6 V.
Keywords :
quality control , photodetector , Geiger-mode , APD , MPPC , mass production
