Author/Authors :
Kostamo، نويسنده , , P. and Shorohov، نويسنده , , M. and Gostilo، نويسنده , , V. and Sipilن، نويسنده , , H. and Kozlov، نويسنده , , V. and Lisitsky، نويسنده , , I. and Kuznetsov، نويسنده , , M. and Lankinen، نويسنده , , A. and Danilewsky، نويسنده , , A.N. and Lipsanen، نويسنده , , H. and Leskelن، نويسنده , , M.، نويسنده ,
Abstract :
Crystal quality of radiation detector-grade TlBr material was analyzed by X-ray diffraction and synchrotron X-ray topography methods. The analyzed TlBr crystals were further processed for electrical characterization and current–voltage characteristics were measured at a temperature range of 210–320 K. The crystals studied in this work were grown by the Bridgman–Stockbarger process. X-ray diffraction measurements show the presence of small-angle grain boundaries in the crystals. The crystal with the most pronounced small-angle boundaries showed the lowest resistivity and the poorest spectroscopic characteristics.
Keywords :
X-ray detector , X-ray topography , ?-ray detector , TlBr
