Title of article :
Setup of an electron probe micro analyzer for highest resolution radioscopy
Author/Authors :
Hanke، نويسنده , , R. and Nachtrab، نويسنده , , F. and Burtzlaff، نويسنده , , S. and Voland، نويسنده , , V. and Uhlmann، نويسنده , , N. and Porsch، نويسنده , , F. and Johansson، نويسنده , , W.، نويسنده ,
Pages :
3
From page :
173
To page :
175
Abstract :
Structural investigation and characterization of objects below the micrometer-scale level often require either big efforts in experimental setup and critical time schedules as is the case with synchrotron sources or a big effort in test object preparation including destructive methods (e.g. grinding) for the investigation within an electron microscope. The limiting factor for high-resolution imaging with conventional X-ray sources is the focal spot size of the X-ray tube used. Focal spot sizes down to 500 nm can be achieved with double-focusing X-ray tubes and transmission targets. To be able to use X-ray transmission imaging for structural investigation with highest resolution in everybodyʹs laboratory, we modified an electron probe micro analyzer (EPMA) to be used as an X-ray source. With this it is possible to obtain electron beam diameters below 200 nm and to produce X-rays using a special transmission target. Due to the low X-ray intensity and in order to profit from the high magnification, a high-resolution, low-noise detector is to be used. We chose a Medipix2 detector for that purpose. We will present the setup and first results of radioscopic images with a resolution of about 240 nm.
Keywords :
High-resolution radioscopy , Nano-material characterization , Nanometer-scale X-ray imaging
Journal title :
Astroparticle Physics
Record number :
2024223
Link To Document :
بازگشت