Author/Authors :
Doyama، نويسنده , , Masao and Kogure، نويسنده , , Yoshiaki and Inoue، نويسنده , , Miyoshi and Kurihara، نويسنده , , Toshikazu and Cao، نويسنده , , Xingzhong and Nishiyama، نويسنده , , Kusuo and Shimomura، نويسنده , , Koichiro، نويسنده ,
Abstract :
A muon beam intensity distribution perpendicular to the beam has been obtained using imaging plates that are commonly used in X-ray science, medical analysis, and transmission electron microscopy. The resolution of the imaging plates depends on the resolution of the imaging plate reader. We have used BAS-TR2025 imaging plates and a Bio-Imaging Analyzer (BAS-2500 or BAS-3000). The positional resolution is 50 μm×50 μm. When the beam is one kind, because a coincidence measurement is not necessary, the muon distribution perpendicular to the beam is taken in a very short time, and the spatial resolution is 50 μm×50 μm. Such a resolution cannot be obtained by the usual muon measuring method. This is quite convenient to adjust muon beams. When FLA-8000 or FLA-9000 is used, the resolution can be improved to 10 μm×10 μm. Such an intensity resolution of muon beams could not be imagined without using imaging plates. Obtained transmission muon images are also presented. This can be used as a non-destructive test.
Keywords :
muons , Muon transmission images , Imaging plates , Solid-state detectors