Author/Authors :
Mengucci، نويسنده , , P. and Di Cristoforo، نويسنده , , Madeline A. and LeBeau، نويسنده , , M. and Majni، نويسنده , , G. and Paone، نويسنده , , N. and Pietroni، نويسنده , , P. and Rinaldi، نويسنده , , D.، نويسنده ,
Abstract :
High-quality scintillating crystals are required for applications in radiographic systems and high-energy physics detectors to achieve the specified optical properties. In order to study the state of the single crystals surface we propose the use of the grazing incidence X-ray diffraction (GID) technique. This technique allows performing a depth profiling of the sample by changing the incidence angle of the X-ray beam with respect to the sample surface. In this work, two samples of a large PbWO4 (PWO) single crystal exhibiting different surface roughness values have been studied. Results have shown that GID is a suitable technique for surface quality inspection.
Keywords :
Scintillation detectors , Grazing incidence X-ray diffraction , surface characterization , Surface treatments
