Author/Authors :
Bu?kowski، نويسنده , , Karol and Kassamakov، نويسنده , , Ivan and Kr?likowski، نويسنده , , Jan and Kierzkowski، نويسنده , , Krzysztof and Kud?a، نويسنده , , Maciej and Maenpaa، نويسنده , , Teppo and Po?niak، نويسنده , , Krzysztof and Rybka، نويسنده , , Dominik and Tuominen، نويسنده , , Eija and Ungaro، نويسنده , , Donatella and Wrochna، نويسنده , , Grzegorz and Zabo?otny، نويسنده , , Wojciech، نويسنده ,
Abstract :
The results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were also investigated, but not observed. For the FLASH memories no single upsets were detected. Only after irradiating with a huge dose permanent damages of devices were observed. For Synchronous Dynamic Random Access Memory (SDRAM), the SEU cross-section was measured.
Keywords :
FPGA , SEU , FLASH , radiation , SDRAM , SRAM
