Author/Authors :
Kiryanov، نويسنده , , S.A. and Sidorenko، نويسنده , , A.F. and Babanov، نويسنده , , Yu.A. and Romashev، نويسنده , , L.N. and Milyaev، نويسنده , , M.A. and Kuznetsov، نويسنده , , V.L. and Ustinov، نويسنده , , V.V. and Vyalikh، نويسنده , , D.V.، نويسنده ,
Abstract :
The investigation of interface in the Fe/Cr multilayer by total electron yield (TEY) is presented. Samples with different thickness of Fe on the top of Cr layer were prepared in situ. TEY measurements were performed using synchrotron radiation at Russian–German beamline (RGBL) (BESSY II). Partial pair correlation functions were determined as a result of the solution of the inverse ill-posed problem. Also, concentration distribution function of solid-state solutions in the interface was obtained using a new technique.
sults obtained demonstrate the BCC solid-state solution with average concentration Fe50Cr50 for interface Fe/Cr.
