Electron optics development for photo-electron spectrometers

The demand for simultaneous observation of photo-electron distributions in several dimensions has made the hemispherical deflection analyzer (HDA) and the time-of-flight (TOF) analyzer the dominating spectrometer types. Some common limiting factors for resolution and sensitivity are considered. Recent developments of the HDA and its lens system which increase the energy range and angular acceptance are described. The properties of a recently developed angle-resolving TOF system (AR-TOF) are also described. The possibility to avoid integration losses in energy or angular resolution by applying non-linear mappings of the primary data is discussed.