Title of article
Preliminary radiation tests of 32 μm thick hydrogenated amorphous silicon films
Author/Authors
Despeisse، نويسنده , , M. and Jarron، نويسنده , , P. Lund-Johansen، نويسنده , , K.M. and Moraes، نويسنده , , D. and Shah، نويسنده , , A. and Wyrsch، نويسنده , , N.، نويسنده ,
Pages
5
From page
88
To page
92
Abstract
Preliminary radiation tests of hydrogenated amorphous silicon n–i–p photodiodes deposited on a coated glass substrate are presented in this paper. These tests have been performed using a 24 GeV proton beam. We report results on the fluence dependence of the diode dark current and of the signal induced by a proton spill.
Keywords
amorphous silicon , Radiation damage
Journal title
Astroparticle Physics
Record number
2026780
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