Title of article :
Beam test of a segmented foil SEM grid
Author/Authors :
Kopp، نويسنده , , S.E. and Indurthy، نويسنده , , Laura D. and Pavlovich، نويسنده , , Z. and Proga، نويسنده , , M. and Zwaska، نويسنده , , R. and Childress، نويسنده , , S. and Ford، نويسنده , , R. and Kendziora، نويسنده , , C. and Kobilarcik، نويسنده , , T. and Moore، نويسنده , , C. and Tassotto، نويسنده , , G.، نويسنده ,
Pages :
9
From page :
138
To page :
146
Abstract :
A prototype Secondary-electron Emission Monitor (SEM) was installed in the 8 GeV proton transport line for the MiniBooNE experiment at Fermilab. The SEM is a segmented grid made with 5 μ m Ti foils, intended for use in the 120 GeV NuMI beam at Fermilab. Similar to previous workers, we found that the full collection of the secondary electron signal requires a bias voltage to draw the ejected electrons cleanly off the foils, and this effect is more pronounced at larger beam intensity. The beam centroid and width resolutions of the SEM were measured at beam widths of 3, 7, and 8 mm, and compared to calculations. Extrapolating the data from this beam test, we expect a centroid and width resolutions of δ x beam = 20 μ m and δ σ beam = 25 μ m , respectively, in the NuMI beam which has 1 mm spot size.
Keywords :
particle beam , Secondary electron emission , instrumentation
Journal title :
Astroparticle Physics
Record number :
2026952
Link To Document :
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