Author/Authors :
Dole?al، نويسنده , , Zden?k and Escobar، نويسنده , , Carlos and Gadomski، نويسنده , , Szymon and Garcia، نويسنده , , Carmen and Gonzalez، نويسنده , , Sergio and Kody?، نويسنده , , Peter W. Kubik، نويسنده , , Petr and Lacasta، نويسنده , , Carlos and Marti، نويسنده , , Salvador and Mitsou، نويسنده , , Vasiliki A. and Moorhead، نويسنده , , Gareth F. and Phillips، نويسنده , , Peter W. and ?ezn??ek، نويسنده , , Pavel and Slav?k، نويسنده , , Radan، نويسنده ,
Abstract :
This paper collects experiences from the development of a silicon sensor laser testing setup and from tests of silicon strip modules (ATLAS End-cap SCT), pixel modules (DEPFET) and large-area diodes using semiconductor lasers. Lasers of 1060 and 680 nm wavelengths were used. A sophisticated method of focusing the laser was developed. Timing and interstrip properties of modules were measured. Analysis of optical effects involved and detailed discussion about the usability of laser testing for particle detectors are presented.
