Author/Authors :
Lefranc، نويسنده , , S. and Piat، نويسنده , , M. and Torre، نويسنده , , J.-P. and Bréelle، نويسنده , , E. and Leriche، نويسنده , , B. and Dumoulin، نويسنده , , L. and Bergé، نويسنده , , L. and Evesque، نويسنده , , C. and Pajot، نويسنده , , F.، نويسنده ,
Abstract :
We present here preliminary results for superconducting NbSi thermometers to be used in TES devices. These thermometers are being made by the CSNSM/IN2P3 in Orsay, France, in parallel to resistive NbSi thermometers, a more common use for this alloy. The critical temperature of these devices is easily tuneable. We present here devices operated and tested at 300 mK using a 3He fridge.
