Author/Authors :
Kvardakov، نويسنده , , V.V. and Podurets، نويسنده , , K.M. and Schetinkin، نويسنده , , S.A. and Baruchel، نويسنده , , J. and Hنrtwig، نويسنده , , J. and Schlenker، نويسنده , , M.، نويسنده ,
Abstract :
The three-dimensional (3D) distribution of defects was investigated in several crystals by synchrotron radiation diffraction tomography. This experimental procedure combines white-beam synchrotron radiation section topography with electronic image recording and computer data processing. A scan involving many section topographs is performed with the same Bragg reflection, resulting in a stack of section topographs containing the 3D information.
