In situ visualization of thermal distortions of synchrotron radiation optics

We have developed a new in situ method to measure heating-induced distortions of the surface of the first monochromator crystal exposed to high-power white synchrotron radiation beam. The method is based on recording the image of a stationary grid of dots captured by a CCD camera as reflected from the surface of a crystal with and without a heat load. The three-dimensional surface profile (heat bump) is then reconstructed from the distortions of the original pattern. In experiments performed at the CHESS A2 wiggler beam line we measured the heat bumps with the heights of up to 600 nm produced by a wiggler beam with total power in the range of 15–60 W incident on the (1 1 1) Si crystal at various angles between 3° and 15°.