A detector system for studying nuclear reactions relevant to Single Event Effects

We describe a device to study reactions relevant for the Single Event Effect (SEE) in microelectronics by means of 200 A and 300 A MeV, inverse kinematics, Si + H and Si + D reactions. The work is focused on the possibility to measure Z = 2 – 14 projectile fragments as efficiently as possible. During commissioning and first experiments the fourth quadrant of the CELSIUS storage ring acted as a spectrometer to register fragments in two planes of Si strip detectors in the angular region 0 ∘ – 0 . 6 ∘ . A combination of ring-structured and sector-structured Si strip detector planes operated at angles 0 . 6 ∘ – 1 . 1 ∘ . For specific event tagging a Si + phoswich scintillator wall operated in the range 3 . 9 ∘ – 11 . 7 ∘ and Si Δ E – E telescopes of CHICSi type operated at large angles.