Author/Authors :
Kuwano، نويسنده , , T. and Hara، نويسنده , , K. and Shinma، نويسنده , , S. and Ikegami، نويسنده , , Y. and Kohriki، نويسنده , , T. and Terada، نويسنده , , S. and Unno، نويسنده , , Y.، نويسنده ,
Abstract :
Among the 981 silicon microstrip modules fabricated by the ATLAS SCT Japan group, 111 modules showed a micro-discharge, a rapid leakage current increase when the bias is raised, below 500 V bias at least once in the series of the quality assurance testing. We have conducted a systematic study to understand the causes, including the hot spot localization using an infrared sensitive camera, and measurement of leakage current decay time.
Keywords :
Silicon microstrip , ATLAS , SCT , Micro-discharge , Hot electron
