Author/Authors :
Liang، نويسنده , , Manchun and Kang، نويسنده , , Kejun and Zhang، نويسنده , , Zhikang and Lou، نويسنده , , Xinghua، نويسنده ,
Abstract :
In this paper we introduce the latest discovery of Low Count Bias (LCB) effect in gamma ray material thickness measurement, which adversely affects the precision of measurement. Theoretical analysis of LCB effect is presented and the correction method is proposed. In order to further prove our theory, Monte Carlo simulation is taken and the result of bias correction is given.
