Title of article :
Degradation of SiGe HBT with reactor pulse neutron and gamma rays irradiation
Author/Authors :
Liu، نويسنده , , Shu-huan and Lin، نويسنده , , Dong-sheng and Guo، نويسنده , , Xiaoqiang and Liu، نويسنده , , Nannan and Jiang، نويسنده , , Xin-biao and Zhu، نويسنده , , Guang-ning and Li، نويسنده , , Da and Wang، نويسنده , , Zhu-jun and Tang، نويسنده , , Ben-qi and Chen، نويسنده , , Wei and Zhang، نويسنده , , Wei and Zhou، نويسنده , , Hui and Shao، نويسنده , , Beibei and Li، نويسنده , , Jun-li، نويسنده ,
Pages :
5
From page :
810
To page :
814
Abstract :
The typical dc electronic parameters degradation of SiGe HBT irradiated by reactor pulse neutron and gamma rays were measured. The mechanisms of transient radiation-induced damage in SiGe HBT were preliminary analyzed.
Keywords :
Pulse reactor , SiGe HBT , Radiation damage
Journal title :
Astroparticle Physics
Record number :
2030777
Link To Document :
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