Author/Authors :
Yates، نويسنده , , Brian and Maxwell، نويسنده , , Dylan and Chen، نويسنده , , Siyue and Truax، نويسنده , , Bruce، نويسنده ,
Abstract :
This paper describes the Canadian Light Source Optical Metrology Facility, in which three complementary measurement systems permit complete analysis of the synchrotron beamline optical components. A newly designed optical tip/tilt stage to handle large synchrotron mirrors will be discussed, and a new software package developed using the ROOT framework to handle curve-fitting and processing of the surface data will be presented.
