Author/Authors :
Yava?، نويسنده , , Hasan and Ercan Alp، نويسنده , , E. and Sinn، نويسنده , , Harald and Alatas، نويسنده , , Ahmet and Said، نويسنده , , Ayman H. and Shvyd’ko، نويسنده , , Yuri and Toellner، نويسنده , , Thomas and Khachatryan، نويسنده , , Ruben and Billinge، نويسنده , , Simon J.L. and Zahid Hasan، نويسنده , , M. and Sturhahn، نويسنده , , Wolfgang، نويسنده ,
Abstract :
We present a sapphire ( Al 2 O 3 ) analyzer for high-resolution X-ray spectroscopy with 31-meV energy resolution. The analyzer is designed for resonant inelastic X-ray scattering (RIXS) measurements at the CuK α absorption edge near 8990 eV. The performance of the analyzer is demonstrated by measuring phonon excitations in beryllium because of its known dynamical structure and high counting rates.
Keywords :
Synchrotron instrumentation , Sapphire , Resonant inelastic X-ray scattering , X-ray spectrometer
