Author/Authors :
Dole?al، نويسنده , , Z. and Drasal، نويسنده , , Z. and Kodys، نويسنده , , P. and Kvasni?ka، نويسنده , , P. and Reznicek، نويسنده , , P. and Scheirich، نويسنده , , D.، نويسنده ,
Abstract :
This paper deals with commonly used semiconductor detector testing methods, i.e. tests with high energy beams, lasers or radioactive beta sources. The systematic effects of the tests are analysed and applicability limits are determined using measurements and simulations.
Keywords :
Beam tests , Position-sensitive detectors , Laser tests , Silicon detectors
