Author/Authors :
Seely، نويسنده , , D.G. and Bruhns، نويسنده , , Josef H. and Savin، نويسنده , , D.W. and Kvale، نويسنده , , T.J. and Galutschek، نويسنده , , E. and Aliabadi، نويسنده , , H. and Havener، نويسنده , , C.C.، نويسنده ,
Abstract :
A rotating dual-wire beam profile monitor based upon a National Electrostatics Corporation Model BPM80 beam profile monitor is described. The device can measure beam profiles in two perpendicular directions (horizontal and vertical) in each of two pseudoplanes that are situated along the beam axis and are separated by a distance of 5.4 cm. The output signal from the device is analyzed in real time to yield horizontal and vertical beam profiles and to calculate the divergence of a particle beam that traverses the device. This set-up is well-suited for merged-beams experiments where one beam is tuned to saved profiles from a second beam in order to minimize the merge angle and beam divergences while maximizing the beam–beam overlaps.
Keywords :
Rotating wire , Overlap , Beam profile monitor , Beam scanner , Merged beams
