Title of article :
Immediate bonding properties of universal adhesives to dentine
Author/Authors :
Muٌoz، نويسنده , , Miguel Angel and Luque، نويسنده , , Issis and Hass، نويسنده , , Viviane and Reis، نويسنده , , Alessandra and Loguercio، نويسنده , , Alessandro Dourado and Bombarda، نويسنده , , Nara Hellen Campanha، نويسنده ,
Pages :
8
From page :
404
To page :
411
Abstract :
AbstractObjectives luate the dentine microtensile bond strength (μTBS), nanoleakage (NL), degree of conversion (DC) within the hybrid layer for etch-and-rinse and self-etch strategies of universal simplified adhesive systems. s caries free extracted third molars were divided into 8 groups for μTBS (n = 5), according to the adhesive and etching strategy: Clearfil SE Bond [CSE] and Adper Single Bond 2 [SB], as controls; Peak Universal Adhesive System, self-etch [PkSe] and etch-and-rinse [PkEr]; Scotchbond Universal Adhesive, self-etch [ScSe] and etch-and-rinse [ScEr]; All Bond Universal, self-etch [AlSe] and etch-and-rinse [AlEr]. After restorations were constructed, specimens were stored in water (37 °C/24 h) and then resin–dentine sticks were prepared (0.8 mm2). The sticks were tested under tension at 0.5 mm/min. Some sticks from each tooth group were used for DC determination by micro-Raman spectroscopy or nanoleakage evaluation (NL). The pH for each solution was evaluated using a pH metre. Data were analyzed with one-way ANOVA and Tukeyʹs test (α = 0.05). s BS, only PkSe and PkEr were similar to the respective control groups (p > 0.05). AlSe showed the lowest μTBS mean (p < 0.05). For NL, ScEr, ScSe, AlSe, and AlEr showed the lowest NL similar to control groups (p < 0.05). For DC, only ScSe showed lower DC than the other materials (p < 0.05). sions mance of universal adhesives was shown to be material-dependent. The results indicate that this new category of universal adhesives used on dentine as either etch-and-rinse or self-etch strategies were inferior as regards at least one of the properties evaluated (μTBS, NL and DC) in comparison with the control adhesives (CSE for self-etch and SB for etch-and-rinse).
Keywords :
Microtensile bond strength , Nanoleakage , Etch-and-rinse , Self-etch , Universal simplified adhesive systems , Degree of conversion
Journal title :
Astroparticle Physics
Record number :
2039639
Link To Document :
بازگشت