• Title of article

    Interpretation of tapping mode atomic force microscopy data using amplitude-phase-distance measurements

  • Author/Authors

    Chen، نويسنده , , X. and Davies، نويسنده , , M.C. and Roberts، نويسنده , , C.J. and Tendler، نويسنده , , S.J.B. and Williams، نويسنده , , P.M. and Davies، نويسنده , , J. and Dawkes، نويسنده , , A.C. and Edwards، نويسنده , , J.C.، نويسنده ,

  • Pages
    11
  • From page
    171
  • To page
    181
  • Abstract
    Vibrating mode force measurements, or amplitude–phase–distance measurements, have been used to experimentally investigate contrast mechanisms in tapping mode atomic force microscopy. Gelatin adsorbed on polystyrene and mica surfaces have been taken as examples to show that the amplitude–phase–distance curves and amplitude–energy loss–distance curves enable the interpretation of artifacts in height images and contrast in phase images. The principles are applicable in general to tapping mode imaging, and are discussed in the context of previously proposed theoretical models, i.e., those based on solution of equations of motion or on energy conservation.
  • Keywords
    Methods and techniques , Imaging , Scanning probe microscopy
  • Journal title
    Astroparticle Physics
  • Record number

    2045175