Reduced density function analysis using convergent electron illumination and iterative blind deconvolution

Previously reduced density function analysis in an electron microscope was restricted to diffraction patterns formed from parallel electron illumination. Through the use of deconvolution techniques, we are able to extend reduced density function analysis to include diffraction patterns formed with convergent electron illumination. This allows the investigation of smaller specimen volumes than is possible with parallel electron illumination. We compare the deconvolution results of iterative blind deconvolution and maximum entropy to highlight the effectiveness of iterative blind deconvolution, in situations where an accurate measurement of the point spread function is not available.