Title of article :
Automated image processing for grain boundary analysis
Author/Authors :
Mahadevan، نويسنده , , Sowmya and Casasent، نويسنده , , David، نويسنده ,
Abstract :
The image processing used in the automated analysis of grain boundaries and triple junctions in scanning electron microscopy images is described. The required image processing includes the location of grain boundaries and triple junctions, calculation of the dihedral angles at triple junctions, and selection of electron backscatter probe points (to obtain grain orientation data).
Keywords :
Electron backscatter pattern , Grain boundary , Orientation imaging microscopy , Triple junction
Journal title :
Astroparticle Physics
