Retrieving modulation parameters from HRTEM images of modulated structures

Quantitative high-resolution transmission electron microscopy (qHRTEM) is methodologically extended towards the assessment of occupationally and positionally modulated structures. For this purpose, iterative digital image matching has been combined with data processing within the Rietveld refinement code JANA2000. In this approach, the number of free parameters is kept low and rather complicated modulated structures become assessable by qHRTEM. The feasibility of the improved methodology is demonstrated for the 1D modulated structure of Ba2TiGe2O8.