Author/Authors :
I Kuljanishvili، نويسنده , , Irma and Chakraborty، نويسنده , , Subhasish and Maasilta، نويسنده , , I.J. and Tessmer، نويسنده , , S.H. and Melloch، نويسنده , , M.R.، نويسنده ,
Abstract :
We present a numerical method to model electric-field-sensitive scanning probe microscopy measurements which allows for a tip of arbitrary shape and invokes image charges to exactly account for a sample dielectric overlayer. The method is applied to calculate the spatial resolution of a subsurface charge accumulation imaging system, achieving reasonable agreement with experiment.
