Title of article :
A multi-wall carbon nanotube (MWCNT) relocation technique for atomic force microscopy (AFM) samples
Author/Authors :
Cao، نويسنده , , Yongzhi and Liang، نويسنده , , Yingchun and Dong، نويسنده , , Shen and Wang، نويسنده , , You، نويسنده ,
Abstract :
A simple relocation technique for atomic force microscopy (AFM), which takes advantage of multi-wall carbon nanotube (MWCNT), is used for investigating repeatedly the imaging of some specific species on the whole substrate with a high relocation accuracy of tens of nanometers. As an example of the application of this technique, TappingMode AFM ex situ study of the morphology transition induced by solvent treatment in a triblock copolymer thin film has been carried out.
Keywords :
Relocate , AFM , Block copolymer , MWCNT
Journal title :
Astroparticle Physics
