Title of article
A multi-wall carbon nanotube (MWCNT) relocation technique for atomic force microscopy (AFM) samples
Author/Authors
Cao، نويسنده , , Yongzhi and Liang، نويسنده , , Yingchun and Dong، نويسنده , , Shen and Wang، نويسنده , , You، نويسنده ,
Pages
6
From page
103
To page
108
Abstract
A simple relocation technique for atomic force microscopy (AFM), which takes advantage of multi-wall carbon nanotube (MWCNT), is used for investigating repeatedly the imaging of some specific species on the whole substrate with a high relocation accuracy of tens of nanometers. As an example of the application of this technique, TappingMode AFM ex situ study of the morphology transition induced by solvent treatment in a triblock copolymer thin film has been carried out.
Keywords
Relocate , AFM , Block copolymer , MWCNT
Journal title
Astroparticle Physics
Record number
2045709
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