Author/Authors :
Meyer، نويسنده , , C.E. and Boothroyd، نويسنده , , C.B. and Gubbens، نويسنده , , A.J. and Krivanek، نويسنده , , O.L.، نويسنده ,
Abstract :
We describe a simple technique for measuring the primary energy of a transmission electron microscope (TEM) using an electron energy-loss spectrometer. The technique is checked against a measurement based on simulating a convergent beam diffraction pattern, and found to be accurate to better than 0.1%.
