The inverse scanning tunneling near-field microscope (ISTOM) or tunnel scanning near-field optical microscope (TSNOM) 3D simulations and application to nano-sources

We propose an application of the ISTOM to characterize nano-sources used in Scanning Near-Field Microscopies. The model takes into account the coupling between the nano-source and the hemispherical lens of the ISTOM set-up. By changing the angle of detection, experimental data are related to the Fourier spectrum of the source. We show “images” calculated with two different distances between tip end and lens surface.