Regularization in the macroscopic self-consistent model for near-field microscopy

The macroscopic self-consistent model for near-field microscopy in two-dimensional geometry is considered. A unified approach for regularization in our macroscopic model is developed and applied to various configurations of the tip-surface system. The configuration with the incoming field being incident from the side of the sample is considered in details. The appropriate regularization parameters are determined and found to be dependent not only on the geometry of the tip-surface system but also on the spatial spectrum of the incident field.