Simultaneous reflection and transmission modes near-field scanning optical microscope

A near-field optical microscope operated simultaneously in reflection and transmission modes is demonstrated. A low noise, large area Si photodetector was mounted directly between the PZT scanning stage and the sample for the transmission measurement. In reflection mode, either a PMT or two large area Si detectors were used for the signal collection. In addition, a simple method for measuring the actual vibrational amplitude in the shear force microscope was also discussed.