Reconstruction of the projected crystal potential from a periodic high-resolution electron microscopy exit plane wave function

A method based on a simulated annealing algorithm is applied for the reconstruction of the projected crystal potential belonging to a periodic high-resolution electron microscopy exit plane wave function. Using simulated exit plane wave functions of GaAs at different specimen thicknesses, the convergence behaviour and the accuracy of the algorithm are investigated. It is demonstrated that the reconstruction is possible even under strongly non-linear scattering conditions at small specimen thicknesses. Further, the convergence of the algorithm to an ambiguous solution beyond a certain specimen thickness is discussed.