Title of article :
Spatial resolution of electron probe X-ray microanalysis on sections of organic (biological) material
Author/Authors :
Krefting، نويسنده , , E.-R. and Felsmann، نويسنده , , M. and Recker، نويسنده , , A. and Feja، نويسنده , , B. and Hِhling، نويسنده , , H.J. and Reichelt، نويسنده , , R. and Reimer، نويسنده , , L.، نويسنده ,
Pages :
9
From page :
13
To page :
21
Abstract :
A locally enhanced element concentration influences the result of an X-ray microanalysis at a neighbouring position. This influence was investigated for the first time systematically in organic (biological) material using sections of epoxy resin (thickness 0.5–2.5 μm) containing a layer of pure gold. Wavelength and energy dispersive spectrometers were applied to analyse the X-rays generated by 15–35 keV electrons. Characteristic X-rays could be detected up to distances of several μm from the gold layer. For example, for a 2.4 μm thick section and 35 keV electrons the measured apparent gold concentration was above 0.1% (weight% per dry mass) at a distance of 10 μm. Thus, the lateral resolution may be not better than a multiple of the section thickness. The apparent gold concentration at a given distance is proportional to the specimen thickness and increases with increasing electron energy. Monte Carlo simulations confirm the experimental results. The influence of a local enrichment depends on the particular specimen properties (e.g. thickness, density, mean atomic number), the electron energy, and the geometry of the detector with respect to the specimen.
Keywords :
Spatial resolution , X-ray microanalysis , section , EPMA , Organic Material
Journal title :
Astroparticle Physics
Record number :
2046875
Link To Document :
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