Title of article
STM analyses of surface phenomena in Si(1 0 0) under proton irradiation
Author/Authors
Wei and Kozodaev، نويسنده , , M.A. and Makeev، نويسنده , , O.N. and Suvorov، نويسنده , , A.L.، نويسنده ,
Pages
7
From page
111
To page
117
Abstract
Detailed investigation of surface phenomena (sputtering, blistering, flaking) at silicon irradiated with 700 keV protons to fluences in the range of 1016–1018 p/cm2 was carried out with the help of an open-air scanning tunneling microscope of original design. Multiple STM images of irradiated sample surfaces containing both intact and broken blisters were analyzed, and their distributions by sizes and evolution under thermal annealing estimated.
Keywords
Silicon , STM , Blistering , Proton irradiation
Journal title
Astroparticle Physics
Record number
2047111
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