• Title of article

    Intermittent contact AFM using the higher modes of weak cantilever

  • Author/Authors

    Ulcinas، نويسنده , , Arturas and Snitka، نويسنده , , Valentinas، نويسنده ,

  • Pages
    6
  • From page
    217
  • To page
    222
  • Abstract
    Employing the higher vibration modes of weak cantilevers enables operating frequencies up to megahertz to be reached, at the same time keeping the force on the sample reasonably low. This allows the interaction time between the tip and the surface to be reduced and should cause the response of surface to be dominated by surface stiffness. The simple distributed mass cantilever model is presented which shows that higher eigenmodes exhibit better sensitivity to surface properties. The images of laser-treated polymer on glass show the ability of the method to distinguish between the material phases with different properties.
  • Keywords
    Atomic force microscopy instruments , Atomic force microscopy surface structure
  • Journal title
    Astroparticle Physics
  • Record number

    2047313