Author/Authors :
Watanabe، نويسنده , , K. and Kotaka، نويسنده , , Y. and Nakanishi، نويسنده , , N. and Yamazaki، نويسنده , , T. and Hashimoto، نويسنده , , I. and Shiojiri، نويسنده , , M.، نويسنده ,
Abstract :
A deconvolution processing of high-resolution high-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) images, combined with maximum entropy method, is applied to two experimental [0 1 1]-Si images; one having unresolved dumbbells and the other having resolved dumbbells and artificial bright spots. The deconvoluted images for these images show bright spots corresponding to the projected atomic columns and no artificial bright spots. Thus, the deconvolution processing provides almost a real projected atomic structure by eliminating effects of the probe function from HAADF STEM images.
Keywords :
Atomic-resolution microscopy , Maximum entropy method , HAADF STEM , Deconvolution
