• Title of article

    On the importance of fifth-order spherical aberration for a fully corrected electron microscope

  • Author/Authors

    Chang، نويسنده , , L.Y. and Kirkland، نويسنده , , A.I. and Titchmarsh، نويسنده , , J.M.، نويسنده ,

  • Pages
    6
  • From page
    301
  • To page
    306
  • Abstract
    Next generation aberration correctors will not only eliminate the third-order spherical aberration, but also improve the information limit by correction of chromatic aberration. As a result of these improvements, higher order aberrations, which have largely been neglected in image analysis, will become important. In this paper, we concern ourselves with situations where sub-إ resolution can be achieved, and where the third-order spherical aberration is corrected and the fifth-order spherical aberration is measurable. We derive formulae to explore the maximum value of the fifth-order spherical aberration for directly interpretable imaging and discuss the optimum imaging conditions and their applicable range.
  • Keywords
    C s and C c -corrected microscope , Phase contrast theory
  • Journal title
    Astroparticle Physics
  • Record number

    2048272