• Title of article

    High resolution non-contact AFM imaging of liquids condensed onto chemically nanopatterned surfaces

  • Author/Authors

    Paolo Checco، نويسنده , , Antonio and Cai، نويسنده , , Yuguang and Gang، نويسنده , , Oleg and Ocko، نويسنده , , Benjamin M.، نويسنده ,

  • Pages
    6
  • From page
    703
  • To page
    708
  • Abstract
    The wetting of ethanol and octane on chemically nanopatterned surfaces has been investigated using Atomic Force Microscopy (AFM) under controlled environmental conditions. The patterns were generated on a methyl-terminated, organic monolayer using an AFM electro-oxidation process. The subsequent wetting of the organic liquids was studied using non-contact mode AFM under equilibrium conditions with the vapor. This study of condensed nanoliquids provides the first reliable measurements of sub 100 nm liquid profile shapes. The derived contact angles give an estimate of the line tension.
  • Keywords
    Non-contact AFM , Wetting , Contact angle , Self-assembled monolayers , Line tension , Chemical patterns , Liquids
  • Journal title
    Astroparticle Physics
  • Record number

    2048329