Title of article :
High resolution non-contact AFM imaging of liquids condensed onto chemically nanopatterned surfaces
Author/Authors :
Paolo Checco، نويسنده , , Antonio and Cai، نويسنده , , Yuguang and Gang، نويسنده , , Oleg and Ocko، نويسنده , , Benjamin M.، نويسنده ,
Pages :
6
From page :
703
To page :
708
Abstract :
The wetting of ethanol and octane on chemically nanopatterned surfaces has been investigated using Atomic Force Microscopy (AFM) under controlled environmental conditions. The patterns were generated on a methyl-terminated, organic monolayer using an AFM electro-oxidation process. The subsequent wetting of the organic liquids was studied using non-contact mode AFM under equilibrium conditions with the vapor. This study of condensed nanoliquids provides the first reliable measurements of sub 100 nm liquid profile shapes. The derived contact angles give an estimate of the line tension.
Keywords :
Non-contact AFM , Wetting , Contact angle , Self-assembled monolayers , Line tension , Chemical patterns , Liquids
Journal title :
Astroparticle Physics
Record number :
2048329
Link To Document :
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