Title of article
Cantilever dynamics and quality factor control in AC mode AFM height measurements
Author/Authors
Chen، نويسنده , , Liwei and Yu، نويسنده , , Xuechun and Wang، نويسنده , , Dan، نويسنده ,
Pages
6
From page
275
To page
280
Abstract
We show that inconsistent-imaging dynamics, in which the cantilever oscillates in the attractive regime on substrate background but in the repulsive regime on sample, leads to artifacts in apparent height in AC mode Atomic force microscopy. Active Q control can be used to effectively tune the imaging dynamics. Increased effective Q promotes the attractive regime, improves imaging sensitivity, and results in less invasive imaging of soft biological molecules.
Keywords
Atomic force microscopy (AFM)
Journal title
Astroparticle Physics
Record number
2048468
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