Author/Authors :
Arslan، نويسنده , , Ilke and Marquis، نويسنده , , Emmanuelle A. and Homer، نويسنده , , Mark and Hekmaty، نويسنده , , Michelle A. and Bartelt، نويسنده , , Norman C.، نويسنده ,
Abstract :
Scanning transmission electron microscope tomography and atom-probe tomography are both three-dimensional techniques on the nanoscale. We demonstrate here the combination of the techniques by analyzing the very same volume of an Al–Ag alloy specimen. This comparison allows us to directly visualize the theoretically known artifacts of each technique experimentally, providing insight into the optimal parameters to use for reconstructions and assessing the quality of each reconstruction. The combination of the techniques for accurate morphology and compositional information in three dimensions at the nanoscale provides a route for a new level of materials characterization and understanding.
Keywords :
Atom-probe tomography , STEM tomography , Three-dimensional reconstructions , Reconstruction artifacts